Detecting Lies and Deceit: Pitfalls and OpportunitiesPublisher: Wiley
Language: English
ISBN: 0470516240
Paperback: 502 pages
Data: Mar 2008
Format: PDF
Description: Detecting Lies and Deceit provides the most comprehensive review of deception to date. This revised edition provides an up-to-date account of deception research and discusses the working and efficacy of the most commonly used lie detection tools, including:

* Behaviour Analysis Interview
* Statement Validity Assessment
* Reality Monitoring
* Scientific Content Analysis
* Several different polygraph tests
* Voice Stress Analysis
* Thermal Imaging
* EEG-P300
* Functional Magnetic Resonance Imaging (fMRI)

All three aspects of deception are covered: nonverbal cues, speech and written statement analysis and (neuro)physiological responses. The most common errors in lie detection are discussed and practical guidelines are provided to help professionals improve their lie detection skills.

Detecting Lies and Deceit is a must-have resource for students, academics and professionals in psychology, criminology, policing and law.


filefactory
Click the link above to download from filefactory
http://filefactory.com/

Please leave message if the download links are dead.
We will update them ASAP!



Related Books

  • 17 Lies That Are Holding You Back and the Truth That Will Set You Free (Audio Book)
  • The Open Source Alternative: Understanding Risks and Leveraging Opportunities
  • Knowledge Discovery for Counterterrorism and Law Enforcement
  • Insider Computer Fraud: An In-depth Framework for Detecting and Defending against Insider IT Attacks
  • Investment Banking and Investment Opportunities in China: A Comprehensive Guide for Finance Professionals
  • Data Mining: Opportunities and Challenges
  • Unit Manufacturing Processes: Issues and Opportunities in Research
  • Java(TM) Puzzlers: Traps, Pitfalls, and Corner Cases
  • Opportunities in Metalworking
  • Information Communication Technologies and City Marketing: Digital Opportunities for Cities Around the World

  • Leave a Reply

    You must be logged in to post a comment.